Spatially-resolved spectroscopic strain measurements at high-power diode laser bars

Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

Volumn , Issue , 2002, Pages 599-

  Tomm, J W ^a   Gerhardt, A ^a   Landesman, J P ^b   Galtier, P ^c   Sainte Marie, Y ^c   Nagle, J ^c  

^a MAX BORN INSTITUT   (Germany)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

^c THALES RESEARCH AND TECHNOLOGY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DATA COMPRESSION; DEFECTS; ELECTRONICS PACKAGING; HEAT SINKS; HIGH POWER LASERS; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; STRAIN MEASUREMENT;

LASER BARS;

SEMICONDUCTOR LASERS;

EID: 0036459529     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. P. Martin, J.P. Landesman, J.P. Hirtz, and A. Fily "Microphotoluminescence mapping of packaging-induced stress distribution in high-power AlGaAs laser diodes" Appl. Phys. Lett. 75, 2521-2523 (1999).
2. J.W. Tomm, R. Müller, A. Bärwolff, T. Elsaesser, D. Lorenzen, F.X. Daiminger, A. Gerhardt, and J. Donecker "Direct spectroscopic measurement of mounting-induced strain in high-power optoelectronic devices" Appl. Phys. Lett. 73, 3908-3910 (1998).