SCOPUS 정보 검색 플랫폼

Volumn 34, Issue 16, 2001, Pages 5627-5634

Dependence of the glass transition temperature of polymer films on interfacial energy and thickness

(8) Fryer, David S a Peters, Richard D a Kim, Eui Jun a Tomaszewski, Jeanne E a De Pablo, Juan J a Nealey, Paul F a White, Chris C b Wu, Wen Li b

a University of Wisconsin ^* (United States)

b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

X RAY REFLECTIVITY;

ELLIPSOMETRY; GLASS TRANSITION; INTERFACIAL ENERGY; LIGHT REFLECTION; POLYMETHYL METHACRYLATES; SURFACE TENSION; THERMOANALYSIS; ULTRATHIN FILMS; X RAYS;

PLASTIC FILMS;

EID: 0035979505 PISSN: 00249297 EISSN: None Source Type: Journal
DOI: 10.1021/ma001932q Document Type: Article

Times cited : (482)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.