Estimation of the thickness dependence of the glass transition temperature in various thin polymer films

Langmuir

Volumn 16, Issue 9, 2000, Pages 4064-4067

  Kim, Jae Hyun ^a   Jang, Jyongsik ^a   Zin, Wang Cheol ^b  

^a Seoul National University   (South Korea)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURVE FITTING; ELLIPSOMETRY; GLASS TRANSITION; MOLECULAR WEIGHT; MORPHOLOGY; OPTICAL MICROSCOPY; ORGANIC POLYMERS; SILICON WAFERS; SPECTROSCOPY; SURFACES; TEMPERATURE;

POLYMETHYL STYRENE FILM; POLYSULFONE FILM; THICKNESS DEPENDENCE;

THIN FILMS;

EID: 0033727784     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la991618t     Document Type: Article

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