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Volumn 79, Issue 1, 2001, Pages 39-47
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Investigation and control of microcracks in tin oxide gas sensing thin-films
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Author keywords
Microcracks; Thin film; Tin oxide
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Indexed keywords
AMORPHOUS SILICON;
ANNEALING;
COPPER;
CRACK PROPAGATION;
DOPING (ADDITIVES);
MICROCRACKS;
PHOSPHORUS;
SCANNING ELECTRON MICROSCOPY;
SPUTTER DEPOSITION;
THIN FILMS;
TIN COMPOUNDS;
SHORT-CIRCUITING PATHWAY MODELS;
CHEMICAL SENSORS;
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EID: 0035949824
PISSN: 09254005
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-4005(01)00846-2 Document Type: Article |
Times cited : (34)
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References (23)
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