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Volumn 79, Issue 1, 2001, Pages 39-47

Investigation and control of microcracks in tin oxide gas sensing thin-films

Author keywords

Microcracks; Thin film; Tin oxide

Indexed keywords

AMORPHOUS SILICON; ANNEALING; COPPER; CRACK PROPAGATION; DOPING (ADDITIVES); MICROCRACKS; PHOSPHORUS; SCANNING ELECTRON MICROSCOPY; SPUTTER DEPOSITION; THIN FILMS; TIN COMPOUNDS;

EID: 0035949824     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(01)00846-2     Document Type: Article
Times cited : (34)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.