Roughness effects on the thermal stability of thin films

Journal of Applied Physics

Volumn 81, Issue 1, 1997, Pages 246-250

  Palasantzas, George ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000572834     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363990     Document Type: Article

References (39)

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