-
3
-
-
0001733162
-
-
J. Cho, S. Cho, B. J. Kim, S. Chae, C. Sone, O. H. Nam, J. W. Lee, Y. Park, and T. I. Kim, Appl. Phys. Lett. 76, 1489 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.76
, pp. 1489
-
-
Cho, J.1
Cho, S.2
Kim, B.J.3
Chae, S.4
Sone, C.5
Nam, O.H.6
Lee, J.W.7
Park, Y.8
Kim, T.I.9
-
4
-
-
0000284043
-
-
D. Hofstetter, R. L. Thorton, L. T. Romano, D. P. Bour, M. Kneissl, and R. M. Donaldson, Appl. Phys. Lett. 73, 2158 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 2158
-
-
Hofstetter, D.1
Thorton, R.L.2
Romano, L.T.3
Bour, D.P.4
Kneissl, M.5
Donaldson, R.M.6
-
5
-
-
0033366076
-
-
A. C. Abare, M. Hansen, J. S. Speck, S. P. DenBaars, and L. A. Coldren, Electron. Lett. 35, 1559 (1999).
-
(1999)
Electron. Lett.
, vol.35
, pp. 1559
-
-
Abare, A.C.1
Hansen, M.2
Speck, J.S.3
Denbaars, S.P.4
Coldren, L.A.5
-
6
-
-
0030080455
-
-
T. Baba, M. Hamasaki, N. Watanabe, P. Kaewplung, A. Matsutani, F. Koyama, and K. Iga, Jpn. J. Appl. Phys., Part 1 35, 1390 (1996).
-
(1996)
Jpn. J. Appl. Phys., Part 1
, vol.35
, pp. 1390
-
-
Baba, T.1
Hamasaki, M.2
Watanabe, N.3
Kaewplung, P.4
Matsutani, A.5
Koyama, F.6
Iga, K.7
-
7
-
-
0031188107
-
-
Y. Yuan, T. Brock, P. Bhattacharya, C. Caneu, and R. Bhat, IEEE Photonics Technol. Lett. 9, 881 (1997).
-
(1997)
IEEE Photonics Technol. Lett.
, vol.9
, pp. 881
-
-
Yuan, Y.1
Brock, T.2
Bhattacharya, P.3
Caneu, C.4
Bhat, R.5
-
8
-
-
0034275055
-
-
C. Marinelli, L. J. Sargent, A. Wonfor, J. M. Rorison, R. V. Penty, I. H. White, G. Hasnain, and R. P. Schneider, Electron. Lett. 36, 1706 (2000).
-
(2000)
Electron. Lett.
, vol.36
, pp. 1706
-
-
Marinelli, C.1
Sargent, L.J.2
Wonfor, A.3
Rorison, J.M.4
Penty, R.V.5
White, I.H.6
Hasnain, G.7
Schneider, R.P.8
-
13
-
-
0001485083
-
-
G. Goldhahn, J. Schiener, S. Shokhovets, T. Frey, U. Koehler, D. J. As, and K. Lishka, Appl. Phys. Lett. 76, 291 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.76
, pp. 291
-
-
Goldhahn, G.1
Schiener, J.2
Shokhovets, S.3
Frey, T.4
Koehler, U.5
As, D.J.6
Lishka, K.7
-
14
-
-
22244443769
-
-
The number of reflections considered represents a reasonable compromise between simulation time and numerical accuracy
-
The number of reflections considered represents a reasonable compromise between simulation time and numerical accuracy.
-
-
-
-
15
-
-
0033333979
-
-
unpublished
-
M. Ariga, Y. Sekido, A. Sakai, T. Baba, A. Matsutani, F. Koyama, and K. Iga, Proceedings of IEEE CLEO (1999), p. 1297 (unpublished).
-
(1999)
Proceedings of IEEE CLEO
, pp. 1297
-
-
Ariga, M.1
Sekido, Y.2
Sakai, A.3
Baba, T.4
Matsutani, A.5
Koyama, F.6
Iga, K.7
-
17
-
-
0025476166
-
-
2-l, where r is the reflection coefficient and l the fraction of power lost across the interface, as in
-
2-l, where r is the reflection coefficient and l the fraction of power lost across the interface, as in N. P. Caponio, M. Goano, I. Maio, M. Meliga, G. P. Bava, G. Destefanis, and I. Montrosset, IEEE J. Sel. Areas Commun. 8, 1203 (1990).
-
(1990)
IEEE J. Sel. Areas Commun.
, vol.8
, pp. 1203
-
-
Caponio, N.P.1
Goano, M.2
Maio, I.3
Meliga, M.4
Bava, G.P.5
Destefanis, G.6
Montrosset, I.7
|