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Volumn 4, Issue , 1999, Pages 1297-1298
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Low threshold GaInAsP lasers with semiconductor/air DBR fabricated by inductively coupled plasma etching
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Author keywords
[No Author keywords available]
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Indexed keywords
DBR LASERS;
FABRICATION;
GALLIUM COMPOUNDS;
INDIUM COMPOUNDS;
INDUCTIVELY COUPLED PLASMA;
SEMICONDUCTOR LASERS;
COMPUTER SIMULATION;
CURRENT DENSITY;
ELECTRON BEAM LITHOGRAPHY;
FINITE DIFFERENCE METHOD;
LIGHT REFLECTION;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
PLASMA ETCHING;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR QUANTUM WELLS;
FDTD SIMULATIONS;
HIGH REFLECTIVITY;
HIGH YIELD;
ICP ETCHING;
INDUCTIVELY COUPLED PLASMA (ICP);
LASING THRESHOLD;
LOW THRESHOLDS;
SIDEWALL ANGLES;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR LASERS;
ANISOTROPIC WET ETCHING;
DISTRIBUTED BRAGG REFLECTORS;
GALLIUM INDIUM ARSENIDE PHOSPHIDE LASERS;
INDUCTIVELY COUPLED PLASMA ETCHING;
THRESHOLD CURRENT;
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EID: 0033333979
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/CLEOPR.1999.814783 Document Type: Conference Paper |
Times cited : (3)
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References (3)
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