Nanostructuring of tips for scanning probe microscopy by ion sputtering: Control of the apex ratio and the tip radius

Journal of Applied Physics

Volumn 90, Issue 10, 2001, Pages 5322-5327

  Hoffrogge, R ^a,b   Kopf, H ^a   Reichelt, R ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b LEO Elektronenmikroskopie GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035890392     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1406548     Document Type: Article

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