Reproducibility of scanning tunneling spectroscopy of Si(111)7 × 7 using a build-up tip

Surface Science

Volumn 355, Issue 1-3, 1996, Pages 21-30

  Tomitori, Masahiko ^a   Sugata, Keiichi ^b   Okuyama, Goro ^b   Kimata, Hideki ^b  

^a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Field emission microscopy; Field evaporation; Scanning tunneling microscopy; Scanning tunneling spectroscopy; Silicon

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; FIELD EMISSION MICROSCOPES; MICROSCOPIC EXAMINATION; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS;

BUILD UP TIP; SCANNING TUNNELING SPECTROSCOPY; THERMAL FIELD EVAPORATION (TFE) TECHNIQUE;

SEMICONDUCTING SILICON;

EID: 0030166192     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01377-6     Document Type: Article

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