Sharpening processes of scanning tunneling microscopy/scanning tunneling spectroscopy tips by thermal field treatment

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 6 SUPPL. B, 1997, Pages 3844-3849

  Nagai, Minoru ^a   Tomitori, Masahiko ^a   Nishikawa, Osamu ^b  

^a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b KANAZAWA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Buildup; FEM; STM; STS; T F treatment; Tip; Tungsten

Indexed keywords

EID: 0001521774     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.3844     Document Type: Article

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