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Volumn 36, Issue 14, 2001, Pages 3565-3571

Microstructure and electrical properties of perovskite (Pb, La)TiO3 thin film deposited at low temperature by the polymeric precursor method

(7) Pontes, F M a Rangel, J H G a Leite, E R a Longo, E a Varela, J A b Araujo E B a Eiras, J A a

a FEDERAL UNIVERSITY OF SÃO CARLOS (Brazil)

b SÃO PAULO STATE UNIVERSITY UNESP (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC PROPERTIES OF SOLIDS; FERROELECTRICITY; LEAD COMPOUNDS; LOW TEMPERATURE EFFECTS; PERMITTIVITY MEASUREMENT; POLARIZATION; POLYCRYSTALLINE MATERIALS; SPIN COATING; X RAY DIFFRACTION ANALYSIS;

LEAD LANTHANUM TITANATE; PARAELECTRIC PHASE; PSEUDOCUBIC STRUCTURE; TETRAGONAL STRUCTURE;

FERROELECTRIC THIN FILMS;

EID: 0035878428 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1023/A:1017953221666 Document Type: Article

Times cited : (20)

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