Pyroelectric properties of sol-gel derived lanthanum modified lead titanate thin films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 5 SUPPL. A, 1996, Pages 2731-2733

  No, Kwangsoo ^a   Choi, Chaun Gi ^a   Yoon, Dae Sung ^a   Sung, Tae Hyun ^a   Kim, Yong Chun ^b   Jeong, In Seop ^b   Lee, Won Jong ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Samsung Electro Mechanics   (South Korea)

Author keywords

Back surface etching; Detectivity; PLT thin film; Pyroelectric coefficient; Sol gel process

Indexed keywords

ANNEALING; CHEMICAL MODIFICATION; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; ELECTRIC VARIABLES MEASUREMENT; ETCHING; FERROELECTRICITY; LANTHANUM; OPTICAL PROPERTIES; PYROELECTRICITY; SOL-GELS; THIN FILMS;

BACK SURFACE ETCHING; CRYSTAL QUALITY; FERROELECTRIC PROPERTIES MEASUREMENT; INFRARED RESPONSIVITY; LANTHANUM MODIFIED LEAD TITANATE THIN FILMS; PYROELECTRIC PROPERTIES; SOL GEL PROCESSES;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 0030146514     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.2731     Document Type: Article

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