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Volumn 64, Issue 4, 2001, Pages

Stability of defects in crystalline silicon and their role in amorphization

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

EID: 0035878366     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.045214     Document Type: Article
Times cited : (111)

References (36)
  • 36
    • 0033713306 scopus 로고    scopus 로고
    • M. Hane, T. Ikezawa, and G. H. Gilmer, Seattle, WA, Sept. 2000, p. 119
    • M. Hane, T. Ikezawa, and G. H. Gilmer, Proceedings of the SISPAD 2000 Conference, Seattle, WA, Sept. 2000, p. 119.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.