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Journal of Applied Physics

Volumn 79, Issue 12, 1996, Pages 8998-9011

Equilibrium concentrations of defects in pure and B-doped silicon

(3) Rasband, Paul B a Clancy, Paulette a Thompson, Michael O a

a School of Operations Research and Industrial Engineering (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001402527 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.362632 Document Type: Article

Times cited : (45)

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