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Volumn 79, Issue 11, 2001, Pages 1643-1645
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Trends in bonding configuration at SiC/III-V semiconductor interfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035839915
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1402162 Document Type: Article |
Times cited : (12)
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References (24)
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