Thickness effects on imprint in chemical-solution-derived (Pb, La)(Zr, Ti)O3 thin films

Applied Physics Letters

Volumn 78, Issue 19, 2001, Pages 2885-2887

  Kim, Seung Hyun ^a   Woo, Hyun Jung ^a   Ha, Jowoong ^a   Hwang, Cheol Seong ^b   Kim, Hae Ryoung ^b   Kingon, Angus I ^c  

^a INOSTEK Inc   (South Korea)

^b Seoul National University   (South Korea)

^c North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035821175     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1370989     Document Type: Article

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