X-ray optical multilayers: Microstructure limits on reflectivity at ultra-short periods

Acta Materialia

Volumn 46, Issue 11, 1998, Pages 3767-3775

  Walton, C C ^a,b,c   Thomas, G ^a,b   Kortright, J B ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b University of California Berkeley   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001088910     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00083-4     Document Type: Article

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