SCOPUS 정보 검색 플랫폼

Journal of Materials Research

Volumn 16, Issue 12, 2001, Pages 3526-3535

Impacts of postannealing ambient atmospheres on Pt/SrBi2.2Ta2O9/Pt capacitors

(6) Li, Ai Dong a Yu, Tao a Ling, Hui Qin a Wu, Di a Liu, Zhi Guo a Ming, Nai Ben a

a NANJING UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CAPACITORS; COMPOSITION; DECOMPOSITION; EVAPORATION; FERROELECTRICITY; MORPHOLOGY; PLATINUM; POLARIZATION; STRONTIUM COMPOUNDS; SUBSTRATES; THIN FILM DEVICES;

METALORGANIC DECOMPOSITION;

FERROELECTRIC THIN FILMS;

EID: 0035739545 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2001.0484 Document Type: Article

Times cited : (1)

References (21)

1
- 0029290956
- (1995) Nature , vol.374 , pp. 627
- Araujo, C.A.¹ Cuchlaro, J.D.² McMillan, L.D.³ Scott, M.C.⁴ Scott, J.F.⁵

2
- 0032154043
- (1998) Jpn. J. Appl. Phys. , vol.37 , pp. 5178
- Kato, K.¹

3
- 0031550757
- (1997) Appl. Phys. Lett. , vol.70 , pp. 1080
- Joshi, P.C.¹ Ryu, S.O.² Zhang, X.³ Desu, S.B.⁴

4
- 0000863303
- (1997) J. Appl. Phys. , vol.82 , pp. 4469
- Zafar, S.¹ Kaushik, V.² Laberge, P.³ Chu, P.⁴ Jones, R.E.⁵ Hance, R.L.⁶ Zurcher, P.⁷ White, B.E.⁸ Tayer, D.⁹ Melnick, B.¹⁰ Gillespie, S.¹¹

5
- 0031356113
- (1997) Integr. Ferroelectr. , vol.16 , pp. 29
- Hase, T.¹ Noguchi, T.² Miyasaka, Y.³

6
- 0032615123
- (1999) Appl. Phys. Lett. , vol.75 , pp. 558
- Kwon, O.S.¹ Hwang, C.S.²

7
- 0034447948
- (2000) Integ. Ferroelectr. , vol.31 , pp. 333
- Yu, T.¹ Wang, D.S.² Wu, D.³ Li, A.D.⁴ Zhu, X.H.⁵ Hu, A.⁶ Liu, Z.G.⁷ Ming, N.B.⁸

8
- 0001041638
- (2000) J. Appl. Phys. , vol.88 , pp. 1035
- Li, A.D.¹ Wu, D.² Ling, H.Q.³ Yu, T.⁴ Wang, M.⁵ Yin, X.B.⁶ Liu, Z.G.⁷ Ming, N.B.⁸

9
- 0030413315
- (1996) Appl. Phys. Lett. , vol.71 , pp. 3839
- Song, T.K.¹ Lee, J.K.² Jung, H.J.³

10
- 0029370052
- (1995) Jpn. J. Appl. Phys. , vol.34 , pp. 5096
- Atsuki, T.¹ Soyama, N.² Yonezawa, T.³ Yonezawa, T.⁴ Ogi, K.⁵

11
- 0000618999
- (1998) Appl. Phys. Lett. , vol.72 , pp. 1374
- Seong, N.J.¹ Yang, C.H.² Shin, W.C.³ Yoon, S.G.⁴

12
- 0000649285
- (2000) J. Appl. Phys. , vol.87 , pp. 1795
- Wu, D.¹ Li, A.D.² Ling, H.Q.³ Yu, T.⁴ Liu, Z.G.⁵ Ming, N.B.⁶

13
- 0342538860
- (2000) Thin Solid Films , vol.375 , pp. 215
- Li, A.D.¹ Wu, D.² Ling, H.Q.³ Yu, T.⁴ Wang, M.⁵ Yin, X.B.⁶ Liu, Z.G.⁷ Ming, N.B.⁸

14
- 0012536716
- submitted for publication
- Appl. Phys. A
- Li, A.D.¹ Wu, D.² Ling, H.Q.³ Liu, Z.G.⁴ Ming, N.B.⁵

15
- 0003859158
- Cambridge University Press, Cambridge, United Kingdom
- (1975) Electron Microprobe Analysis , pp. 223
- Reed, S.G.¹

16
- 0032154292
- (1998) Jpn. J. Appl. Phys. , vol.37 , pp. 5112
- Chen, P.C.¹ Miki, H.² Shimamoto, Y.³ Matsui, Y.⁴

17
- 0031212119
- (1997) J. Mater. Res. , vol.12 , pp. 2165
- Chert, T.C.¹ Li, T.² Zhang, X.³ Desu, S.B.⁴

18
- 0001680674
- (2000) Appl. Phys. Lett. , vol.76 , pp. 2208
- Wu, D.¹ Li, A.D.² Ling, H.Q.³ Yu, T.⁴ Liu, Z.G.⁵ Ming, N.B.⁶

19
- 0027853416
- Ferroelectric Thin Films III, edited by E.R. Myers, B.A. Tuttle, S.B. Desu, and P.K. Larsen (Pittsburgh, PA)
- (1993) Mater. Res. Soc. Symp. Proc. , vol.310 , pp. 87
- Dimos, D.¹ Warren, W.L.² Tuttle, B.A.³

20
- 0345962141
- (1996) Appl. Phys. Lett. , vol.68 , pp. 690
- Al-Shareef, H.N.¹ Dimos, D.² Boyle, T.J.³ Warren, W.L.⁴ Turtle, B.A.⁵

21
- 0030216895
- (1996) J. Appl. Phys. , vol.80 , pp. 1682
- Dimos, D.¹ Al-Shareef, H.A.² Warren, W.L.³ Tuttle, B.A.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.