Oxide interfacial phases and the electrical properties of SrBi2Ta2O9 thin films prepared by plasma-enhanced metalorganic chemical vapor deposition

Applied Physics Letters

Volumn 72, Issue 11, 1998, Pages 1374-1376

  Seong, Nack Jin ^a   Yang, Cheol Hoon ^a   Shin, Woong Chul ^a   Yoon, Soon Gil ^a  

^a Chungnam National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000618999     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121059     Document Type: Article

References (13)

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