Structure development studies of SrBi2(Ta1-xNbx)2O9 thin films

Journal of Materials Research

Volumn 12, Issue 8, 1997, Pages 2165-2174

  Chen, Tze Chiun ^a   Li, Tingkai ^a   Zhang, Xubai ^a   Desu, Seshu B ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION EFFECTS; FERROELECTRIC MATERIALS; GRAIN GROWTH; GRAIN SIZE AND SHAPE; HYSTERESIS; PHASE TRANSITIONS; REFRACTIVE INDEX; STRONTIUM COMPOUNDS; THERMAL EFFECTS; THICKNESS MEASUREMENT; THIN FILMS;

SPECTROSCOPIC ELLIPSOMETRY;

DIELECTRIC FILMS;

EID: 0031212119     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1997.0290     Document Type: Article

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