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Volumn , Issue , 2001, Pages 525-528

Interconnecting device opportunities for gigascale integration (GSI)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRIC CABLES; ELECTRIC CONDUCTIVITY; ELECTRIC INSULATORS; ELECTRIC LOSSES; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; LOGIC GATES; LSI CIRCUITS; PERFORMANCE; PERMITTIVITY; TRANSISTORS;

EID: 0035716692     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (30)

References (13)
  • 2
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    • Apr.
    • (1995) Proc. IEEE , vol.83 , pp. 619-635
    • Meindl, J.D.1
  • 3
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    • International technology roadmap for semiconductors (ITRS)
    • Edition, SIA
    • (1999)
  • 7
    • 2442653656 scopus 로고    scopus 로고
    • Interconnect limits on gigascale integration (GSI) in the 21st century
    • March
    • (2001) Proc. IEEE , vol.89 , Issue.3 , pp. 305-324
    • Davis, J.A.1
  • 8
    • 0002624009 scopus 로고    scopus 로고
    • A three-dimensional stochastic wire length distribution for variable separation of strata
    • San Francisco, June
    • (2000) IEEE IITC , pp. 132-134
    • Joyner, J.1
  • 10
    • 0035058589 scopus 로고    scopus 로고
    • Sea of leads: A disruptive paradigm for a system-on-a-chip (SoC)
    • San Francisco, Feb.
    • (2001) IEEE ISSCC , pp. 280-281
    • Naeemi, A.1
  • 11
    • 84962862626 scopus 로고    scopus 로고
    • Multi-I/O and reconfigurable RF/wireless interconnect based on near field capacitive coupling and multiple access techniques
    • June 5-7
    • (2000) Proc. IEEE IITC , pp. 21-22
    • Chang, M.F.1
  • 12
    • 0000894702 scopus 로고    scopus 로고
    • Rationale and challenges for optical interconnects to electronic chips
    • June
    • (2000) Proc. IEEE , vol.88 , Issue.6 , pp. 728-749
    • Miller, D.A.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.