Specification based digital compatible built-in test of embdded analog circuits

Proceedings of the Asian Test Symposium

Volumn , Issue , 2001, Pages 344-349

  Halder, Achintya ^a   Chatterjee, Abhijit ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; COMPARATOR CIRCUITS; COMPUTER SIMULATION; ELECTRIC FILTERS; WAVEFORM ANALYSIS;

ANALOG CIRCUITS; SYSTEM ON CHIPS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0035703865     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)

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