HABIST: Histogram-based analog built in self test

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 760-767

  Frisch, A ^a   Almy, T ^a  

^a TEKTRONIX INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DATA COMPRESSION; ERROR ANALYSIS; HEURISTIC METHODS; IMAGE COMPRESSION; STATISTICAL TESTS;

HISTOGRAM BASE ANALOG BUILT IN SELF TEST (HABIST);

INTEGRATED CIRCUIT TESTING;

EID: 0031358781     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)