BIST technique for a frequency response and intermodulation distortion test of a sigma-delta ADC

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1994, Pages 60-65

  Toner, M F ^a   Roberts, G W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; COMPUTATIONAL COMPLEXITY; DIGITAL SIGNAL PROCESSING; ELECTRIC NETWORK ANALYSIS; FREQUENCY RESPONSE; INTERMODULATION; SIGNAL DISTORTION;

BUILT IN SELF TEST; SIGMA DELTA ANALOG TO DIGITAL CONVERTERS;

INTEGRATED CIRCUIT TESTING;

EID: 0028750181     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)