A built-in self-test and self-diagnosis scheme for heterogeneous SRAM clusters

Proceedings of the Asian Test Symposium

Volumn , Issue , 2001, Pages 103-108

  Wang, Chih Wea ^a   Tzeng, Ruey Shing ^a   Wu, Chi Feng ^a   Huang, Chih Tsun ^a   Wu, Cheng Wen ^a   Huang, Shi Yu ^a   Lin, Shyh Horng ^a   Wang, Hsin Po ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; EMBEDDED SYSTEMS; MATHEMATICAL MODELS; PROGRAM COMPILERS; SCHEDULING; STATIC RANDOM ACCESS STORAGE;

BUILT-IN SELF DIAGNOSIS; EMBEDDED STATIC RANDOM ACCESS STORAGE; FINITE STATE MACHINE; MARCH CW TEST ALGORITHM;

BUILT-IN SELF TEST;

EID: 0035701267     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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