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Volumn 19, Issue 4, 2001, Pages 1078-1082

Low temperature deposition and characterization of polycrystalline Si films on polymer substrates

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS MATERIALS; CONDENSATION; FILM GROWTH; GRAIN SIZE AND SHAPE; LOW TEMPERATURE EFFECTS; MAGNETRON SPUTTERING; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

EID: 0035393840     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1345905     Document Type: Article
Times cited : (8)

References (38)
  • 27
    • 0004472194 scopus 로고
    • Rep. No. 2309, General Mills, MN, unpublished
    • (1962)
    • Whener, G.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.