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Volumn 19, Issue 4, 2001, Pages 1078-1082
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Low temperature deposition and characterization of polycrystalline Si films on polymer substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
AMORPHOUS MATERIALS;
CONDENSATION;
FILM GROWTH;
GRAIN SIZE AND SHAPE;
LOW TEMPERATURE EFFECTS;
MAGNETRON SPUTTERING;
POLYCRYSTALLINE MATERIALS;
RAMAN SPECTROSCOPY;
SEMICONDUCTING SILICON;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
POLYCRYSTALLINE FILMS;
SEMICONDUCTING FILMS;
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EID: 0035393840
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1345905 Document Type: Article |
Times cited : (8)
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References (38)
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