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Volumn 30, Issue 6, 2001, Pages 779-784
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HgCdTe growth on (552) oriented CdZnTe by metalorganic vapor phase epitaxy
a a b b b c c |
Author keywords
Cadmium zinc telluride; Infrared detector; Mercury cadmium telluride; Metalorganic vapor phase epitaxy (MOVPE)
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Indexed keywords
CADMIUM COMPOUNDS;
INFRARED DETECTORS;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MORPHOLOGY;
QUANTUM EFFICIENCY;
RADIOMETRY;
SURFACES;
THICK FILMS;
TRANSPORT PROPERTIES;
X RAY CRYSTALLOGRAPHY;
X RAY DIFFRACTION ANALYSIS;
BACK-REFLECTION LAUE X RAY DIFFRACTION;
CADMIUM ZINC TELLURIDE;
ETCH PIT DENSITY MEASUREMENT;
MERCURY CADMIUM TELLURIDE;
MID-WAVE INFRARED PHOTODIODE DETECTOR ARRAY;
X RAY DOUBLE CRYSTAL ROCKING CURVE;
MERCURY COMPOUNDS;
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EID: 0035360045
PISSN: 03615235
EISSN: None
Source Type: Journal
DOI: 10.1007/BF02665872 Document Type: Article |
Times cited : (7)
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References (23)
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