Complete Mueller matrix measurement with a single high frequency modulation

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 47-52

  Compain, Eric ^a   Drevillon, Bernard ^a   Huc, Jean ^a   Parey, Jean Yves ^a   Bouree, Jean Eric ^a  

^a LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

Mueller matrix; Polarimeter; Polarization modulation; Real time; Rough surface

Indexed keywords

AMORPHOUS SILICON; ELECTROOPTICAL DEVICES; FREQUENCY MODULATION; LIGHT MEASUREMENT; LIGHT MODULATION; LIGHT POLARIZATION; LIGHT REFLECTION; MATRIX ALGEBRA; PHOTODETECTORS; POLARIMETERS; SURFACE ROUGHNESS;

HIGH FREQUENCY MODULATION; MUELLER MATRIX;

ELLIPSOMETRY;

EID: 0032002282     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00767-0     Document Type: Article

References (14)

1. R.M. Azzam, Opt. Lett. 2 (1978) 148.
2. P.S. Hauge, J. Opt. Soc. Am. 68 (1978) 1519.
3. D.H. Goldstein, Appl. Opt. 31 (1992) 6676.
4. R.C. Thompson, J. R Bottiger, E.S. Fry, Appl. Opt. 19 (1980) 1323.
5. W.M. McClain, W.H. Jeng, B. Pati, Y. Shi, D. Tian, Appl. Opt. 33 (1994) 1230.
6. A.J. Hunt, D.R. Huffman, Rev. Sci. Instrum. 44 (1973) 1753.
7. R.J. Perry, A.J. Hunt, D.R. Huffman, Appl. Opt. 17 (1978) 2700.
8. R. Anderson, Appl. Opt. 31 (1992) 11.
9. B.W. Bell, Opt. Eng. 28 (1989) 114.
10. E. Conpain, B. Drevillon, Rev. Sci. Instrum. 68 (1997) 2671.
11. Y. Cui, R.M. Azzam, Opt. Lett. 21 (1996) 89.
12. G.E. Jellison, Opt. Lett. 12 (1987) 766.
13. S. Krishnan, J. Opt. Soc. Am. A 9 (1992) 1615.
14. S. Krishnan, P.C. Nordine, Appl. Opt. 33 (1994) 4184.