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Volumn 45, Issue 1, 2001, Pages 71-77

6.5 kV clustered insulated gate bipolar transistor in homogeneous base technology

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MOSFET DEVICES; SEMICONDUCTOR DOPING; SUBSTRATES; THYRISTORS;

EID: 0035157150     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00240-9     Document Type: Article
Times cited : (3)

References (23)
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  • 6
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    • (1993) IEDM , vol.28 , pp. 31-34
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    • (1999) IEDM , pp. 811-814
    • Ohashi, H.1
  • 9
    • 0003385409 scopus 로고    scopus 로고
    • Clustered IGBT - A new power semiconductor device
    • Allied Publishers; ISBN No. 81-7023-998-2
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    • (1999) Proc IWPSD'99 , pp. 1307-1312
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    • (1989) Trans Electron Dev , vol.ED-33 , pp. 1667-1670
    • Mogro-Campero, A.1    Love, R.P.2    Chang, M.F.3    Dyer, R.4
  • 14
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    • Electrothermal simulations in punch-through and non-punch-through IGBTs
    • Pendharkar S., Trivedi M., Shenai K. Electrothermal simulations in punch-through and non-punch-through IGBTs. IEEE Trans Electron Dev. 45(10):1998;2222-2231.
    • (1998) IEEE Trans Electron Dev , vol.45 , Issue.10 , pp. 2222-2231
    • Pendharkar, S.1    Trivedi, M.2    Shenai, K.3
  • 15
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.