Optimal sensitivity for molecular recognition MAC-mode AFM

Ultramicroscopy

Volumn 82, Issue 1-4, 2000, Pages 227-235

  Schindler, H ^a   Badt, D ^a   Hinterdorfer, P ^a   Kienberger, F ^a   Raab, A ^a   Wielert Badt, S ^a   Pastushenko, V Ph ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Force microscopy; Molecular recognition; Oscillator model

Indexed keywords

COMPUTATIONAL METHODS; MAGNETIC DEVICES; MATHEMATICAL MODELS; MOLECULES; OPTIMIZATION; SENSITIVITY ANALYSIS; SURFACES;

MOLECULAR RECOGNITION FORCE MICROSCOPY (MRFM); OSCILLATOR MODEL;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; CROSS LINKING; MOLECULAR RECOGNITION; OSCILLATION;

EID: 0033967987     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00146-1     Document Type: Article

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