Energetics and diffusivity of atomic boron in silicon by density-functional-based tight-binding simulations

Computational Materials Science

Volumn 22, Issue 1-2, 2001, Pages 44-48

  Alippi, Paola ^a   Colombo, Luciano ^a   Ruggerone, Paolo ^a  

^a UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL DEFECTS; DIFFUSION; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; PROBABILITY DENSITY FUNCTION; SEMICONDUCTING SILICON;

INTERSTITIAL ATOMS;

SEMICONDUCTING BORON;

EID: 0034826680     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0256(01)00163-X     Document Type: Conference Paper

References (17)