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Volumn 221, Issue 1-4, 2000, Pages 475-480

AFM study and optical properties of GaAsN/GaAs epilayers grown by MOVPE

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; DIFFUSION IN SOLIDS; FILM GROWTH; METALLORGANIC VAPOR PHASE EPITAXY; MORPHOLOGY; NITRIDES; NUCLEATION; SEMICONDUCTING FILMS;

EID: 0034505627     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00747-8     Document Type: Article
Times cited : (13)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.