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Volumn 221, Issue 1-4, 2000, Pages 475-480
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AFM study and optical properties of GaAsN/GaAs epilayers grown by MOVPE
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
DIFFUSION IN SOLIDS;
FILM GROWTH;
METALLORGANIC VAPOR PHASE EPITAXY;
MORPHOLOGY;
NITRIDES;
NUCLEATION;
SEMICONDUCTING FILMS;
GALLIUM ARSENIC NITRIDE;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0034505627
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(00)00747-8 Document Type: Article |
Times cited : (13)
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References (14)
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