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Volumn 220, Issue 3, 2000, Pages 191-196
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Initial stages of InN thin film growth onto MgAl2O4(1 1 1) and α-Al2O3(0 0·1) substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FILM GROWTH;
MAGNESIUM COMPOUNDS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SUBSTRATES;
THIN FILMS;
HIGH-QUALITY LAYERS;
SEMICONDUCTING FILMS;
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EID: 0034501162
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(00)00548-0 Document Type: Article |
Times cited : (19)
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References (22)
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