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Volumn , Issue , 2000, Pages 114-119

Fsimac: A fault simulator for asynchronous sequential circuits

Author keywords

[No Author keywords available]

Indexed keywords

GATE-LEVEL FAULT SIMULATORS;

EID: 0034496879     PISSN: 10817735     EISSN: None     Source Type: Journal    
DOI: 10.1109/ATS.2000.893612     Document Type: Article
Times cited : (13)

References (18)
  • 3
    • 0033079540 scopus 로고    scopus 로고
    • Min-max timing analysis and an application to asynchronous circuits
    • Feb
    • S. Chakraborty, D. Dill, and K. Yun. Min-max timing analysis and an application to asynchronous circuits. Proceedings of the IEEE, 87(2):332-346, Feb. 1999.
    • (1999) Proceedings of the IEEE , vol.87 , Issue.2 , pp. 332-346
    • Chakraborty, S.1    Dill, D.2    Yun, K.3
  • 7
    • 0025419945 scopus 로고
    • A partial scan method for sequential circuits with feedback
    • April
    • K. Cheng and V. Agrawal. A partial scan method for sequential circuits with feedback. IEEE Transactions on Computers, C-39(4):544-548, April 1990.
    • (1990) IEEE Transactions on Computers , vol.C-39 , Issue.4 , pp. 544-548
    • Cheng, K.1    Agrawal, V.2
  • 8
    • 0033169549 scopus 로고    scopus 로고
    • Implementation of a self-resetting CMOS 64-Bit parallel adder with enhanced testability
    • Aug
    • W. Hwang, G. Gristede, P. Sanda, S. Wang, and D. Heidel. Implementation of a Self-Resetting CMOS 64-Bit Parallel Adder with Enhanced Testability. IEEE Journal of SolidState Circuits, 34(8): 1108-1117, Aug. 1999.
    • (1999) IEEE Journal of SolidState Circuits , vol.34 , Issue.8 , pp. 1108-1117
    • Hwang, W.1    Gristede, G.2    Sanda, P.3    Wang, S.4    Heidel, D.5
  • 11
    • 0026819183 scopus 로고
    • PROOFS: A fast, memory-efficient sequential circuit fault simulator
    • Feb
    • T. Niermann, W.-T. Cheng, and J. Patel. PROOFS: A fast, memory-efficient sequential circuit fault simulator. IEEE Transactions on Computer-Aided Design, 11(2): 198-207, Feb. 1992.
    • (1992) IEEE Transactions on Computer-Aided Design , vol.11 , Issue.2 , pp. 198-207
    • Niermann, T.1    Cheng, W.-T.2    Patel, J.3
  • 12
    • 0030400761 scopus 로고    scopus 로고
    • Test quality of asynchronous circuits: A defect-oriented evaluation
    • Oct
    • M. Roncken and E. Bruls. Test quality of asynchronous circuits: A defect-oriented evaluation. In Proc. International Test Conference, pages 205-214, Oct. 1996.
    • (1996) Proc. International Test Conference , pp. 205-214
    • Roncken, M.1    Bruls, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.