Computer-aided fault to defect mapping (CAFDM) for defect diagnosis

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 729-738

  Stanojevic, Zoran ^a   Balachandran, Hari ^b   Walker, D M H ^a   Lakhani, Fred ^c   Jandhyala, Sri ^b   Saxena, Jayashree ^b   Butler, Kenneth M ^b  

^a TEXAS A AND M UNIVERSITY   (United States)

^b TEXAS INSTRUMENTS   (United States)

^c SEMATECH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; COMPUTER SOFTWARE; DEFECTS; FAILURE ANALYSIS;

COMPUTER AIDED FAULT TO DEFECT MAPPING; DEFECT DIAGNOSIS; STUCK AT FAULT MODEL;

INTEGRATED CIRCUIT TESTING;

EID: 0034481991     PISSN: 10893539     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2000.894269     Document Type: Article

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