Properties of single dendrimer molecules studied by atomic force microscopy

Langmuir

Volumn 16, Issue 23, 2000, Pages 9009-9014

  Zhang, Hua ^a   Grim, P C M ^a   Foubert, P ^a   Vosch, T ^a   Vanoppen, P ^a   Wiesler, U M ^b   Berresheim, A J ^b   Mullen K ^b   De Schryver, F C ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; AGGLOMERATION; ATOMIC FORCE MICROSCOPY; COATING TECHNIQUES; MICA; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; STIFFNESS; THIN FILMS; WATER;

DENDRIMERS; PULSED FORCE MODE; SPIN COATING;

ORGANIC POLYMERS;

EID: 0034319589     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la000201g     Document Type: Article

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56. 11b This leads to an average tip curvature radius of 114 ± 43 nm. This large value for the tip radius was confirmed by SEM images of the tips that are used in the experiments. SEM images have been taken of the tip used in the experiments and of several other tips (used and unused ones). They all show a tip radius of around 100 nm, in contrast to manufacturer values of 10-20 nm. From the values for the tip radius and the observed width of the G4-Td molecules, the height of the dendrimer molecules was determined as 6.2 ± 1.7 nm. This demonstrates that the relatively large value of the tip radius accounts for the observed width of the individual dendrimer molecules.
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