Increasing importance of electronic thermal noise in Sub-0.1 /mi Si-MOSFETs

IEICE Transactions on Electronics

Volumn E83-C, Issue 8, 2000, Pages 1203-1211

  Sano, Nobuyuki ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Central limit theorem; Current fluctuation; Monte carlo simulation; Shot noise; Thermal noise

Indexed keywords

COMPUTER SIMULATION; CORRELATION METHODS; ELECTRIC CURRENTS; ELECTRONS; INTEGRAL EQUATIONS; MONTE CARLO METHODS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DOPING; SHOT NOISE; THERMAL NOISE;

CENTRAL LIMIT THEOREM; CHANNEL ELECTRONS; DRAIN CURRENT; ELECTRONIC THERMAL NOISE; QUASI EQUILIBRIUM THERMAL NOISE;

MOSFET DEVICES;

EID: 0034246582     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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