Current Fluctuation Characteristic of Sub-0.1 Micron Device Structures: A Monte Carlo Study

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 5 PART 2, 1999, Pages 531-533

  Sano, Nobuyuki ^a   Natori, Kenji ^a   Matsuzawa, Kazuya ^b   Mukai, Mikio ^b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b Semiconduct Technol Acad Res C   (Japan)

Author keywords

Current fluctuation; Monte Carlo simulation; Quasi ballistic transport; Shot noise; Thermal noise

Indexed keywords

EID: 0041627391     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.l531     Document Type: Article

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