Sub-0.1 μm device simulation technology: Another problems for Monte Carlo simulations

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Volumn , Issue , 1999, Pages 23-26

  Sano, Nobuyuki ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS; MONTE CARLO METHODS;

CURRENT FLUCTUATIONS; STANDARD DEVIATIONS;

MOSFET DEVICES;

EID: 0033284982     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)