Finding fault with deep-submicron ICs

IEEE Spectrum

Volumn 34, Issue 10, 1997, Pages 39-50

  Vallett, David P ^a   Soden, Jerry M ^b  

^a IBM MICROELECTRONICS   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85008042443     PISSN: 00189235     EISSN: None     Source Type: Journal    
DOI: 10.1109/6.625244     Document Type: Review

References (0)