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Volumn 13, Issue 1, 2000, Pages 61-75

An efficient photoresist development simulator based on cellular automata with experimental verification

Author keywords

Cellular automata; Development; Modeling; Photolithography; Simulation

Indexed keywords

AUTOMATA THEORY; COMPUTER SIMULATION; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS;

EID: 0033890541     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.827346     Document Type: Article
Times cited : (37)

References (40)
  • 4
    • 0027663444 scopus 로고
    • An efficient volume removal algorithm for practical three-dimensional lithography simulation with experimental verification
    • E. W. Scheckler, N. N. Tam, A. K. Pfau, and A. R. Neureuther, "An efficient volume removal algorithm for practical three-dimensional lithography simulation with experimental verification," IEEE Trans. Computer-Aided Design, vol. 12, no. 9, pp. 1345-1356, 1993.
    • (1993) IEEE Trans. Computer-Aided Design , vol.12 , Issue.9 , pp. 1345-1356
    • Scheckler, E.W.1    Tam, N.N.2    Pfau, A.K.3    Neureuther, A.R.4
  • 5
    • 0028377543 scopus 로고
    • Models and algorithms for three-dimensional topography simulation with SAMPLE-30
    • E. W. Scheckler and A. R. Neureuther, "Models and algorithms for three-dimensional topography simulation with SAMPLE-30," IEEE Trans. Computer-Aided Design, vol. 13, no. 5, pp. 219-230, 1994.
    • (1994) IEEE Trans. Computer-Aided Design , vol.13 , Issue.5 , pp. 219-230
    • Scheckler, E.W.1    Neureuther, A.R.2
  • 7
    • 0029373706 scopus 로고
    • Algorithms and models for cellular based topography simulation
    • E. Strasser and S. Selberherr, "Algorithms and models for cellular based topography simulation," IEEE Trans. Computer-Aided Design, vol. 14, no. 9, pp. 1104-1114, 1995.
    • (1995) IEEE Trans. Computer-Aided Design , vol.14 , Issue.9 , pp. 1104-1114
    • Strasser, E.1    Selberherr, S.2
  • 8
    • 0031076208 scopus 로고    scopus 로고
    • 3-D topography simulator (3-D MUL SS) based on a physical description of material topography
    • M. Fujinaga and N. Kotani, "3-D topography simulator (3-D MUL SS) based on a physical description of material topography," IEEE Trans. Electron Devices, vol. 44, no. 2, pp. 226-238, 1997.
    • (1997) IEEE Trans. Electron Devices , vol.44 , Issue.2 , pp. 226-238
    • Fujinaga, M.1    Kotani, N.2
  • 12
    • 0024718454 scopus 로고
    • A cellular automaton describing the formation of spatially ordered structures in chemical systems
    • M. Gerhard and H. Schuster, " A cellular automaton describing the formation of spatially ordered structures in chemical systems," Physica D, vol. 36, no. 3, pp. 209-221, 1989.
    • (1989) Physica D , vol.36 , Issue.3 , pp. 209-221
    • Gerhard, M.1    Schuster, H.2
  • 13
    • 0347183614 scopus 로고
    • Cellular-automaton-based simulation of 2D polymer dynamics
    • J. M. Vianney and A. Koelman, "Cellular-automaton-based simulation of 2D polymer dynamics," Physical Rev. Lett., vol. 64, no. 16, pp. 1915-1918, 1990.
    • (1990) Physical Rev. Lett. , vol.64 , Issue.16 , pp. 1915-1918
    • Vianney, J.M.1    Koelman, A.2
  • 16
    • 0026141976 scopus 로고
    • Scientific modeling with massively parallel SIMD computers
    • N. B. Wilding, A. S. Trew, K. A. Hawick, and G. S. Pawley, "Scientific modeling with massively parallel SIMD computers," Proc. IEEE, vol. 79, no. 4, pp. 574-585, 1991.
    • (1991) Proc. IEEE , vol.79 , Issue.4 , pp. 574-585
    • Wilding, N.B.1    Trew, A.S.2    Hawick, K.A.3    Pawley, G.S.4
  • 17
    • 0020496569 scopus 로고
    • Simulating physics with cellular automata
    • G. Y. Vichniac, "Simulating physics with cellular automata," Physica D, vol. 10, no. 4, pp. 96-116, 1984.
    • (1984) Physica D , vol.10 , Issue.4 , pp. 96-116
    • Vichniac, G.Y.1
  • 18
    • 0020495097 scopus 로고
    • Cellular automata as an alternative to (rather than an approximation of) differential equations in modeling physics
    • T. Toffoli, "Cellular automata as an alternative to (rather than an approximation of) differential equations in modeling physics," Physica D, vol. 10, no. 4, pp. 117-127, 1984.
    • (1984) Physica D , vol.10 , Issue.4 , pp. 117-127
    • Toffoli, T.1
  • 19
    • 0008069298 scopus 로고    scopus 로고
    • Impact of locality and dimensionality limits on architectural trends
    • Los Alamitos, CA
    • D. J. Matzke, "Impact of locality and dimensionality limits on architectural trends," in Proc. Workshop Physics and Computation (PhysComp'94), Los Alamitos, CA, pp. 30-35.
    • Proc. Workshop Physics and Computation (PhysComp'94) , pp. 30-35
    • Matzke, D.J.1
  • 21
    • 0029378440 scopus 로고
    • Simulation of two-dimensional photoresist etching process in integrated circuit fabrication using cellular automata
    • I. Karafyllidis and A. Thanailakis, "Simulation of two-dimensional photoresist etching process in integrated circuit fabrication using cellular automata," Modeling Simulation Materials Sci. Eng., vol. 3, no. 5, pp. 629-642, 1995.
    • (1995) Modeling Simulation Materials Sci. Eng. , vol.3 , Issue.5 , pp. 629-642
    • Karafyllidis, I.1    Thanailakis, A.2
  • 22
    • 0030086631 scopus 로고    scopus 로고
    • Simulation of the image reversal submicron process in integrated circuit fabrication
    • I. Karafyllidis and A. Thanailakis, "Simulation of the image reversal submicron process in integrated circuit fabrication," Semiconduct. Sci. Technol., vol. 11, no. 2, pp. 214-220, 1996.
    • (1996) Semiconduct. Sci. Technol. , vol.11 , Issue.2 , pp. 214-220
    • Karafyllidis, I.1    Thanailakis, A.2
  • 24
    • 0022115424 scopus 로고
    • Image reversal of positive photoresist: Characterization and modeling
    • H. Klose, R. Sigush, and W. Arden, "Image reversal of positive photoresist: Characterization and modeling," IEEE Trans. Electron Devices, vol. ED-32, no. 3, pp. 1654-1662, 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , Issue.3 , pp. 1654-1662
    • Klose, H.1    Sigush, R.2    Arden, W.3
  • 29
    • 0003146721 scopus 로고
    • Polymers in Electronics
    • Washington, DC: American Chemical Society
    • H. Ito and C. G. Wilson, Polymers in Electronics, ACS Symposium Series 242. Washington, DC: American Chemical Society, 1984, pp. 11-23.
    • (1984) ACS Symposium Series 242 , pp. 11-23
    • Ito, H.1    Wilson, C.G.2
  • 31
    • 0031235775 scopus 로고    scopus 로고
    • Simulation of the negative chemical amplification deep-ultraviolet process in integrated circuit fabrication
    • I. Karafyllidis, "Simulation of the negative chemical amplification deep-ultraviolet process in integrated circuit fabrication," Microelectron. Eng., vol. 34, no. 2, pp. 155-170, 1997.
    • (1997) Microelectron. Eng. , vol.34 , Issue.2 , pp. 155-170
    • Karafyllidis, I.1
  • 34
    • 0018519566 scopus 로고
    • Reaction mechanism of melamine resins
    • W. Blank, "Reaction mechanism of melamine resins," J. Coatings Technol., vol. 51, no. 2, pp. 61-70, 1979.
    • (1979) J. Coatings Technol. , vol.51 , Issue.2 , pp. 61-70
    • Blank, W.1
  • 35
    • 0011867310 scopus 로고
    • Materials for Microlithography
    • Washington, DC: American Chemical Society
    • M. Bowden, Materials for Microlithography, ACS Symposium Series 266. Washington, DC: American Chemical Society, 1984, pp. 71-79.
    • (1984) ACS Symposium Series 266 , pp. 71-79
    • Bowden, M.1
  • 36
    • 0012694876 scopus 로고    scopus 로고
    • Negative resist corner rounding. Envelope volume modeling
    • P. I. Hagouel, A. R. Neureuther, and A. M. Zenk, "Negative resist corner rounding. Envelope volume modeling," J. Vacuum Sci. Technol., vol. B-14, no. 6, pp. 4257-4261, 1996.
    • (1996) J. Vacuum Sci. Technol. , vol.B-14 , Issue.6 , pp. 4257-4261
    • Hagouel, P.I.1    Neureuther, A.R.2    Zenk, A.M.3
  • 37
    • 0031655497 scopus 로고    scopus 로고
    • Dependence of developed negative resist profiles on exposure energy dose: Experiment, modeling, and simulation
    • Mar.
    • P. I. Hagouel, I. Karafyllidis, and A. R. Neureuther, "Dependence of developed negative resist profiles on exposure energy dose: Experiment, modeling, and simulation," Microelectron. Eng., vol. 41/42, pp. 351-354, Mar. 1998.
    • (1998) Microelectron. Eng. , vol.41-42 , pp. 351-354
    • Hagouel, P.I.1    Karafyllidis, I.2    Neureuther, A.R.3
  • 38
    • 0001368709 scopus 로고    scopus 로고
    • Developer temperature effect on negative deep ultraviolet resists: Characterization, modeling, and simulation
    • 6
    • P. I. Hagouel, I. Karafyllidis, and A. R. Neureuther, "Developer temperature effect on negative deep ultraviolet resists: Characterization, modeling, and simulation," J. Vacuum Sci. Technol., vol. 15, pp. 2616-2620, 6 1997.
    • (1997) J. Vacuum Sci. Technol. , vol.15 , pp. 2616-2620
    • Hagouel, P.I.1    Karafyllidis, I.2    Neureuther, A.R.3
  • 39
    • 0000205870 scopus 로고    scopus 로고
    • Negative resist profiles in 248 nm photolithography: Experiment, modeling and simulation
    • I. Karafyllidis, P. I. Hagouel, and A. R. Neureuther, "Negative resist profiles in 248 nm photolithography: Experiment, modeling and simulation," Semiconduct. Sci. Technol., vol. 13, no. 1, pp. 603-610, 1998.
    • (1998) Semiconduct. Sci. Technol. , vol.13 , Issue.1 , pp. 603-610
    • Karafyllidis, I.1    Hagouel, P.I.2    Neureuther, A.R.3
  • 40
    • 0033076980 scopus 로고    scopus 로고
    • Negative resist profiles of close-spaced parallel and isolated lines: Experiment, modeling and simulation
    • I. Karafyllidis, P. I. Hagouel, and A. R. Neureuther, "Negative resist profiles of close-spaced parallel and isolated lines: Experiment, modeling and simulation," Microelectron. Eng., vol. 45, pp. 71-84, 1999.
    • (1999) Microelectron. Eng. , vol.45 , pp. 71-84
    • Karafyllidis, I.1    Hagouel, P.I.2    Neureuther, A.R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.