An electrical method for measuring the difference in bandgap across the neutral base in SiGe HBT's

IEEE Transactions on Electron Devices

Volumn 47, Issue 4, 2000, Pages 797-804

  Tang, Yue Teng ^a   Hamel, John S ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

Bandgap grading; Bipolar; Sige hbt

Indexed keywords

BANDGAP GRADING;

CHEMICAL VAPOR DEPOSITION; COMPUTER SIMULATION; ENERGY GAP; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DOPING;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0033878428     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.830996     Document Type: Article

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