Numerical simulation of neutron radiation effects in avalanche photodiodes

IEEE Transactions on Electron Devices

Volumn 47, Issue 3, 2000, Pages 529-536

  Osborne, Mark D ^a   Hobson, Peter R ^a   Watts, Stephen J ^a  

^a BRUNEL UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; COMPUTER SIMULATION; NEUTRONS; RADIATION DAMAGE; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; STATISTICS;

AVALANCHE PHOTODIODES (APD); NEUTRON RADIATION DAMAGE; SHOCKLEY-READ-HALL STATISTICS; TIME-INDEPENDENT SEMICONDUCTOR EQUATIONS;

PHOTODIODES;

EID: 0033877344     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.824722     Document Type: Article

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