Bulk damage effects in irradiated silicon detectors due to clustered divacancies

Journal of Applied Physics

Volumn 82, Issue 1, 1997, Pages 126-136

  Gill, K ^a   Hall, G ^b   MacEvoy, B ^b  

^a CERN   (Switzerland)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001478514     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365790     Document Type: Article

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