On the reverse short channel effect in deep submicron heterojunction MOSFET's and its impact on the current-voltage behavior

IEEE Transactions on Electron Devices

Volumn 47, Issue 6, 2000, Pages 1214-1220

  Collaert, Nadine ^a   Verheyen, Peter ^a   De Meyer, Kristin ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; DOPING (ADDITIVES); HETEROJUNCTIONS; SEMICONDUCTOR DEVICE MODELS; THRESHOLD VOLTAGE;

REVERSE SHORT CHANNEL EFFECT; SOFTWARE PACKAGE MEDICI; THRESHOLD VOLTAGE ROLL-OFF; VERTICAL ADVANCED HETEROJUNCTION MOSFET;

MOSFET DEVICES;

EID: 0033747812     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.842964     Document Type: Article

References (10)

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