Ti/Pt/Au ohmic contacts on p-type GaN/ AlxGa1-xN superlattices

Electronics Letters

Volumn 36, Issue 1, 2000, Pages 91-93

  Zhou, L ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE MEASUREMENT; GOLD; METALLIZING; OHMIC CONTACTS; PLATINUM; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DOPING; TITANIUM;

LOW SPECIFIC CONTACT RESISTANCE; OHMIC METALLIZATION METHOD;

SEMICONDUCTOR SUPERLATTICES;

EID: 0033640135     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20000028     Document Type: Article

References (11)

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