-
1
-
-
0041643620
-
Effect of material and design parameters on the stresses induced in a Direct-Chip-Attach package during underfill cure
-
Mauna Lani, HI, June 15-19
-
K. Ramakrishna and Z. Johnson, "Effect of material and design parameters on the stresses induced in a Direct-Chip-Attach package during underfill cure," in Proc. InterPack '97, Mauna Lani, HI, June 15-19, 1997, pp. 1639-1646.
-
(1997)
Proc. InterPack '97
, pp. 1639-1646
-
-
Ramakrishna, K.1
Johnson, Z.2
-
2
-
-
0008603689
-
Coffin-Manson based fatigue analysis of underfilled DCA
-
Mauna Lani, HI, June 15-19
-
V. Gektin, A. Bar-Cohen, and S. Witzman, "Coffin-Manson based fatigue analysis of underfilled DCA," in Proc. InterPack '97, Mauna Lani, HI, June 15-19, 1997, pp. 1655-1661.
-
(1997)
Proc. InterPack '97
, pp. 1655-1661
-
-
Gektin, V.1
Bar-Cohen, A.2
Witzman, S.3
-
3
-
-
0032231094
-
Reliability investigations of flip chip interconnects in FCOB and FCOG applications by FEA
-
Singapore, Dec. 8-10
-
A. Schubert, R. Dudek, and R. Döring, "Reliability investigations of flip chip interconnects in FCOB and FCOG applications by FEA," in Proc. 2nd Electron. Packag. Technol. Conf., Singapore, Dec. 8-10, 1998, pp. 49-56.
-
(1998)
Proc. 2nd Electron. Packag. Technol. Conf.
, pp. 49-56
-
-
Schubert, A.1
Dudek, R.2
Döring, R.3
-
4
-
-
0030712703
-
Thermomechanical stresses in an underfilled flip chip DCA
-
Braselton, GA, Mar. 9-12
-
C. A. Le Gall, J. Qu, and D. L. McDowell, "Thermomechanical stresses in an underfilled flip chip DCA," in Proc. 3rd Int. Symp. Exihibition Adv. Packag. Mater., Braselton, GA, Mar. 9-12, 1997, pp. 128-129.
-
(1997)
Proc. 3rd Int. Symp. Exihibition Adv. Packag. Mater.
, pp. 128-129
-
-
Le Gall, C.A.1
Qu, J.2
McDowell, D.L.3
-
6
-
-
85037134766
-
Low cost bumping by stencil printing: Process qualification for 200 μm pitch
-
San Diego, CA
-
J. Kloeser et al., "Low cost bumping by stencil printing: Process qualification for 200 μm pitch," in Proc. IMAPS Conf., San Diego, CA, 1998.
-
(1998)
Proc. IMAPS Conf.
-
-
Kloeser, J.1
-
7
-
-
33749905354
-
Strategies for low cost flip chip assembly
-
Sunnyvale, CA
-
A. Ostmann, J. Kloeser, R. Aschenbrenner, and H. Reichl, "Strategies for low cost flip chip assembly," in Proc. ITAB Symp., Sunnyvale, CA, 1998.
-
(1998)
Proc. ITAB Symp.
-
-
Ostmann, A.1
Kloeser, J.2
Aschenbrenner, R.3
Reichl, H.4
-
8
-
-
0004989155
-
Solder flip chips employing electroless nickel: An evaluation of reliability and cost
-
F. Stepniak, "Solder flip chips employing electroless nickel: an evaluation of reliability and cost," Adv. Electron. Packag., vol. 1, 1997.
-
(1997)
Adv. Electron. Packag.
, vol.1
-
-
Stepniak, F.1
-
9
-
-
0032093433
-
FE-simulation for polymeric packaging materials
-
June
-
R. Dudek, M. Scherzer, A. Schubert, and B. Michel, "FE-simulation for polymeric packaging materials," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 21, pp. 301-309, June 1998.
-
(1998)
IEEE Trans. Comp., Packag., Manufact. Technol. A
, vol.21
, pp. 301-309
-
-
Dudek, R.1
Scherzer, M.2
Schubert, A.3
Michel, B.4
-
10
-
-
0004413996
-
Materials mechanics and mechanical reliability of flip chip assemblies on organic substrates
-
July/Aug.
-
A. Schubert, R. Dudek, D. Vogel, B. Michel, and H. Reichl, "Materials mechanics and mechanical reliability of flip chip assemblies on organic substrates," Adv. Microelectron., vol. 24, no. 4, pp. 29-32, July/Aug. 1997.
-
(1997)
Adv. Microelectron.
, vol.24
, Issue.4
, pp. 29-32
-
-
Schubert, A.1
Dudek, R.2
Vogel, D.3
Michel, B.4
Reichl, H.5
-
11
-
-
0030678362
-
An efficient approach to predict solder fatigue life and its application to SM- And area array components
-
San Jose, CA, May
-
R. Dudek, M. Nylen, A. Schubert, B. Michel, and H. Reichl, "An efficient approach to predict solder fatigue life and its application to SM- and area array components," in Proc. ECTC'47, San Jose, CA, May 1997, pp. 462-471.
-
(1997)
Proc. ECTC'47
, pp. 462-471
-
-
Dudek, R.1
Nylen, M.2
Schubert, A.3
Michel, B.4
Reichl, H.5
-
12
-
-
0042913844
-
Thermo-mechanical reliability analysis of flip chip assemblies by combined microDAC and the finite element method
-
Mauna Lani, HI, June 15-19
-
A. Schubert, R. Dudek, J. Auersperg, D. Vogel, B. Michel, and H. Reichl, "Thermo-mechanical reliability analysis of flip chip assemblies by combined microDAC and the finite element method," in Proc. InterPack '97, Mauna Lani, HI, June 15-19, 1997, pp. 1647-1654.
-
(1997)
Proc. InterPack '97
, pp. 1647-1654
-
-
Schubert, A.1
Dudek, R.2
Auersperg, J.3
Vogel, D.4
Michel, B.5
Reichl, H.6
-
13
-
-
0029697087
-
Delamination cracking in encapsulated flip chips
-
Orlando, FL, May
-
C. A. Le Gall, J. Qu, and D. L. McDowell, "Delamination cracking in encapsulated flip chips," in Proc. 46th Electron. Comp. Technol. Conf., Orlando, FL, May 1996, pp. 430-434.
-
(1996)
Proc. 46th Electron. Comp. Technol. Conf.
, pp. 430-434
-
-
Le Gall, C.A.1
Qu, J.2
McDowell, D.L.3
-
14
-
-
0032230571
-
Parametric finite element Analysis of solder joint reliability of flip chip on board
-
Singapore, Dec. 8-10
-
T. J. Goh, "Parametric finite element Analysis of solder joint reliability of flip chip on board," in Proc. 2nd Electron. Packag. Technol. Conf., Singapore, Dec. 8-10, 1998, pp. 57-62.
-
(1998)
Proc. 2nd Electron. Packag. Technol. Conf.
, pp. 57-62
-
-
Goh, T.J.1
-
15
-
-
0344926130
-
Role of underfilling imperfections on flip-chip reliability
-
Mauna Lani, HI, June 15-19
-
St. Michaelides and S. Sitaraman, "Role of underfilling imperfections on flip-chip reliability," in Proc. InterPack '97, Mauna Lani, HI, June 15-19, 1997, pp. 1487-1493.
-
(1997)
Proc. InterPack '97
, pp. 1487-1493
-
-
Michaelides, St.1
Sitaraman, S.2
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