Measurement-based mathematical active device modeling for high frequency circuit simulation

IEICE Transactions on Electronics

Volumn E82-C, Issue 6, 1999, Pages 924-935

  Root, David E ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

Circuit simulation; Device modeling; Large signal nonlinear; Measurement based

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; LINEAR NETWORK SYNTHESIS; MATHEMATICAL TRANSFORMATIONS; NONLINEAR NETWORK SYNTHESIS;

LARGE SIGNAL ANALYSIS; SMALL SIGNAL ANALYSIS;

SEMICONDUCTOR DEVICE MODELS;

EID: 0033318971     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (27)

1. D.E. Root, Measurement-based Mathematical Device Modeling For Nonlinear Circuit Simulation, in preparation by Kluwer Academic Press, 1999.
2. D.E.Root "On table-based, models, IEEE MTT-S International Microwave Symposium Workshop on Nonlinear Measurements and Modeling (WMC), Denver, CO, June 1997. [3] B. Hughes and P. Tasker, Bias-dependence of the MODFET intrinsic model element values at microwave frequencies, IEEE Trans. Electron Devices, vol.36, no. 10, pp.2267-2273, 1989.
3. D.E. Root, Measurement-based active device modeling for circuit simulation, European Microwave Conference Advanced Microwave Devices, Characterization, and Modeling Workshop, Madrid, Spain, Sept. 1993.
4. T. Narhi, Frequency domain analysis of strongly nonlinear circuits using a consistent large-signal model, IEEE Trans. Microwave Theory & Tech., vol.44, no.2, pp.182-192, Feb. 199G.
5. G.G. Morton, J.S. Atherton, C.M. Snowden, R.D. Pollard, and M.J. Howes, A large-signal physical HEMT model, 1996 IEEE MTT-S Technical Digest, pp.1759-1762, 1996.
6. D.E. Root, S. Fan, and J. Meyer, Technology independent non quasi-static FET models by direct construction from automatically characterized device data, 21st European Microwave Conference Proceedings, Stuttgart, Germany, pp.927-932, Sept. 1991.
7. D.E. Root, M. Pirola, S. Fan, W.J. Anklam, and A. Cognata, Measurement-based large-signal microwave diode model for circuit and device design, IEEE Trans. Microwave Theory & Tech., pp.2211-2217, Dec. 1993.
8. D.E. Root and S. Fan, Experimental evaluation of largesignal modeling assumptions based on vector analysis of bias-dependent 5-parameter data from MESFETs and IIEMTs, 1992 IEEE MTT-S International Microwave Symposium Technical Digest, pp.255-259, 1992.
9. D.E. Root "Elements of measurement-based large-signal device modeling, 1998 IEEE Radio and Wireless Conference (RAWCON) Workshop on Modeling and Simulation of Devices and Circuits for Wireless Communication Systems, Colorado Springs, Aug. 1998.
10. V. Rizzoli, A. Costanzo, C. Cecchetti, and A. Chiarini, A nonlinear model of the power MESFET including temperature and breakdown effects, IEEE MTT-S International Microwave Symposium Technical Digest, Baltimore, MD, pp.1603-1606, June 1998.
11. D.E. Root "Foundations of measurement-based modeling for nonlinear circuit simulation, 1996 IEEE MTT-S International Microwave Symposium Workshop on New Directions in Nonlinear RF and Microwave Characterization, San Francisco, CA, June 1996.
12. J.B. Scott, J.G. Rathmell, A.E. Parker, and M.M. Sayed, Pulsed device measurements and applications, IEEE Trans. Microwave Theory & Tech., vol.44, no.12, pp.27182723, Dec. 1996.
13. CNRF, Pulsed-bias semiconductor parameter analyzer, 1996.[On-line]. Available: URL: http://mpcc.mq.edu.au/ elec/cnerf/apspa
14. A.E. Parker and D.E. Root, Pulse measurements quantify dispersion in PHEMTs, ISSSE, Pisa, Italy, Sept. 1998.
15. P.J. Tasker, M. Demmler, M. Schlechtweg, and M. Ferndndez Barciela "Novel approach to the extraction of transistor parameters from large-signal measurements, 24th European Microwave Conference Proceedings, Cannes, France, pp.1301-1306, Sept. 1994.
16. F. van Raay and G. Kompa, A new large signal waveform measurement system with 40 GHz harmonic bandwidth, IEEE International Microwave Symposium MTT-S Technical Digest, pp.1345-1438, 1992.
17. J. Meyer, D.E. Root, and K. Poulton, Dynamic electrothermal modeling, Thermal Workshop at 1993 International Microwave Conference, Atlanta, Georgia, June 1993.
18. M. Fernandez-Barciela, P.J. Tasker, M. Demmler, Y. Campos-Roca, H. Massler, E. Sanchez, C. Curras-Francos, and M. Schlechtweg, Simplified nonquasi-static FET modeling approach experimentally validated up to 118.5 GHz, 1997 IEEE MTT-S International Microwave Symposium Technical Digest, Denver, CO, pp.1499-1502, June 1997.
19. "Nonlinear Network Measurement System Technology Update, Revision 1.0, Hewlett-Packard Company, Santa Rosa Systems Division, Dec. 10, 1997.
20. D. Schreurs, J. Verspecht, B. Nauwelaers, A. Van de Capelle, and M. Van Rossum, Procedure to extract the nonlinear HEMT model from vectorial non-linear network analyzer measurements, International IEEE Workshop on Experimentally Based FET Device Modeling and Related Nonlinear Circuit Design, Kassel, Germany, pp. 20.1 - 20.7, July 1997.
21. Z. Ouarch, J.M. Collantes, J.P. Teyssier, and R. Quere, Measurement-based nonlinear electro-thermal modeling of GaAs FET with dynamical trapping effects, 1998 IEEE International Microwave Symposium MTT-S Technical Digest, Baltimore, MD, pp.599-602, June 1998.
22. F. Filicore, G. Vannini, and V.A. Monaco, A nonlinear integral model of electron devices for HB circuit analysis, IEEE Trans. Microwave Theory & Tech., vol.42, pp.10881091, 1992.
23. F. Filicori, G. Vannini, A. Santarelli, A.M. Sanchez, A. Tazon, and Y. Newport, Empirical modeling of lowfrequency dispersive effects due to traps and thermal phenomena in III-V FETs, IEEE Trans. Microwave Theory & Tech., vol.43, no.12, pp.2972-2981, Dec. 1995.
24. M. Pirola, D.E. Root, and G. Ghione, Large-signal performance of measurement-based diode models for nonlinear circuit simulation: A comparison, 1995 European Microwave Conference Technical Digest, Bologna, Italy, pp.lOOG-1010, 1995.
25. E.X. Li, N. Scheinberg, D. Stofman, and W. Tompkins, An independently matched parameter SPICE model for GaAs MESFETs, IEEE J. Solid-State Circuits, vol.30, no.8, pp.872-880, Aug. 1995.
26. S. Haykin and J. Principe, Making sense of a complex world, IEEE Signal Processing Magazine, vol.15, no 3. pp.66-81, May 1998.
27. H.D.I Abarbanel, T.W. Frison, and L.S. Tsimring, Obtaining order in a world of chaos, IEEE Signal Processing Magazine, vol.15, no 3. pp.49-G5, May 1998.