Measurement-Based Large-Signal Diode Modeling System for Circuit and Device Design

IEEE Transactions on Microwave Theory and Techniques

Volumn 41, Issue 12, 1993, Pages 2211-2217

  Root, David E ^a   Pirola, Marco ^b   Fan, Siqi ^a   Anklam, William J ^a   Cognata, Alex ^a  

^a HEWLETT PACKARD COMPANY   (United States)

^b POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT OSCILLATIONS; CIRCUIT THEORY; HARMONIC GENERATION; HIGH ELECTRON MOBILITY TRANSISTORS; INTERPOLATION; MICROWAVE DEVICES; MICROWAVE MEASUREMENT; RELAXATION OSCILLATORS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DIODES; TUNING;

AUTOMATED SYSTEM; CIRCUIT SIMULATION; DEVICE DESIGN; FOURTH HARMONIC POWER LEVELS; LARGE SIGNAL DIODE MODEL; OSCILLATION FREQUENCY; RELAXATION TIME; VARACTOR DIODE; VARACTOR TUNED OSCILLATOR CIRCUIT; VARACTOR TUNING VOLTAGE;

SEMICONDUCTOR DEVICE MODELS;

EID: 0027813328     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.260708     Document Type: Article

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