Experimental evaluation of large-signal modeling assumptions based on vector analysis of bias-dependent S-parameter data from MESFETs and HEMTs

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 1992, Pages 255-258

  Root, David E ^a   Fan, Siqi ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTROMAGNETIC WAVE SCATTERING; EQUIVALENT CIRCUITS; HIGH ELECTRON MOBILITY TRANSISTORS; NONLINEAR NETWORKS; VECTORS;

BIAS-DEPENDENT S-PARAMETERS; LARGE-SIGNAL MODELING; NONLINEAR CAPACITORS; TERMINAL CHARGE CONSERVATION; VECTOR ANALYSIS;

MESFET DEVICES;

EID: 0026881708     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)